X-ray diffraction line profile analysis of KBr thin films
نویسندگان
چکیده
منابع مشابه
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ژورنال
عنوان ژورنال: Applied Physics A
سال: 2016
ISSN: 0947-8396,1432-0630
DOI: 10.1007/s00339-016-0293-3